Various Specimen Preparation Methods for Transmission Electron Microscope
نویسندگان
چکیده
منابع مشابه
Specimen Preparation for Electron Microscopy
In general the SEM sample preparation techniques are more or less similar to the metallographic sample preparation technique for optical microscopy, because both the microscopes reveals the surface topography of sample. In SEM a focussed beam of electrons scans over the specimen surface and the electrons emitted from the sample surface controls the brightness of the CRT spot which also scans th...
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ژورنال
عنوان ژورنال: Journal of the Japan Society of Colour Material
سال: 2006
ISSN: 0010-180X
DOI: 10.4011/shikizai1937.79.152